Cheng-Teng Yueh

Title: Cheng-Teng Yueh: Innovator in Measurement Technologies

Introduction

Cheng-Teng Yueh is a notable inventor based in Son en Breugel, Netherlands. He has made significant contributions to the field of measurement technologies, particularly through his innovative patent. His work focuses on improving the accuracy of measurements on substrates, which is crucial in various scientific and industrial applications.

Latest Patents

Cheng-Teng Yueh holds a patent titled "Methods for measuring at least one target on a substrate and associated apparatuses and substrate." This patent discloses a method for determining a correction for measurements of targets on a substrate. The targets include both parameter-sensitive and parameter-insensitive sub-targets. The method involves obtaining measurement values for each type of sub-target and determining corrections to enhance measurement accuracy.

Career Highlights

Cheng-Teng Yueh is currently employed at ASML Netherlands B.V., a leading company in the semiconductor industry. His role involves developing advanced measurement techniques that are essential for the production of high-precision semiconductor devices. His expertise in this area has contributed to the company's reputation for innovation and excellence.

Collaborations

Cheng-Teng Yueh has collaborated with several talented individuals in his field, including Miguel Garcia Granda and Karel Hendrik Wouter Van Den Bos. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Cheng-Teng Yueh is a prominent inventor whose work in measurement technologies has the potential to impact various industries significantly. His innovative approaches and collaborations continue to drive advancements in the field.