This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Utechzone Co., Ltd.. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Cheng-Hua Hsieh: Innovator in Automated Optical Inspection
Introduction
Cheng-Hua Hsieh is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of automated optical inspection through his innovative patent. His work focuses on integrating deep learning systems into inspection processes, enhancing efficiency and accuracy.
Latest Patents
Cheng-Hua Hsieh holds a patent for an "Automated optical inspection and classification apparatus based on a deep learning system and training apparatus thereof." This invention provides a sophisticated solution that includes a camera and a processor. The processor executes a deep learning system after loading data from a storage unit. It comprises an input layer, a neural network layer group, and a fully connected-layer group. The neural network layer group extracts features from input images, while the fully connected-layer group performs weight-based classification and outputs inspection results. This innovative approach significantly improves the inspection process in various applications.
Career Highlights
Cheng-Hua Hsieh is associated with Utechzone Co., Ltd., where he applies his expertise in developing advanced inspection technologies. His work has positioned him as a key figure in the industry, contributing to the advancement of automated systems.
Collaborations
Cheng-Hua has collaborated with notable professionals in his field, including Arulmurugan Ambikapathi and Chien-Chung Lin. These collaborations have further enriched his work and expanded the impact of his innovations.
Conclusion
Cheng-Hua Hsieh is a distinguished inventor whose contributions to automated optical inspection are noteworthy. His innovative patent demonstrates the potential of deep learning systems in enhancing inspection processes. His work continues to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile