The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2022

Filed:

Jun. 27, 2019
Applicant:

Utechzone Co., Ltd., New Taipei, TW;

Inventors:

Arulmurugan Ambikapathi, New Taipei, TW;

Chien-Chung Lin, New Taipei, TW;

Cheng-Hua Hsieh, New Taipei, TW;

Assignee:

UTECHZONE CO., LTD., New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G01N 21/01 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G01N 21/01 (2013.01); G06N 20/00 (2019.01);
Abstract

The present invention provides an automated optical inspection and classification apparatus based on a deep learning system, comprising a camera and a processor. The processor executes a deep learning system after loading data from a storage unit and the processor, and comprises an input layer, a neural network layer group, and a fully connected-layer group. The neural network layer group is for extracting to an input image and thereby obtaining a plurality of image features. The fully connected-layer group is for performing weight-based classification and outputting an inspection result.


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