Cheng Dong

Title: Cheng Dong - Innovator in Material Analysis

Introduction

Cheng Dong is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of material analysis through his innovative methods and systems. His work focuses on utilizing crystal structure databases to enhance material analysis processes.

Latest Patents

Cheng Dong holds a patent for a "Crystal structure database-based material analysis method and system, and application." This patent discloses a material analysis method that compares experimental pattern information obtained from a to-be-tested sample with theoretical pattern information calculated from material structure data in the crystal structure database. The method allows for the intelligent analysis of crystallographic information and phase composition of the sample, including space group, unit cell parameters, and specific coordinates of atoms in the unit cell. This innovative approach enables large-scale high-throughput and high-precision material analysis, laying the groundwork for a data mining and analysis platform for material patterns. He has 1 patent to his name.

Career Highlights

Cheng Dong is affiliated with Peking University, where he continues to advance his research in material analysis. His work has garnered attention for its potential applications in various scientific fields.

Collaborations

Cheng has collaborated with notable colleagues, including Feng Pan and Shunning Li, to further enhance the impact of his research and innovations.

Conclusion

Cheng Dong's contributions to material analysis through his patented methods demonstrate his commitment to advancing scientific knowledge and technology. His work is paving the way for future innovations in the field.