This inventor holds 1 USPTO granted patent. Top assignee: The 13Th Research Institute of China Electronics Technology Group Corporation. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Chen Ding: Innovator in Thermoreflectance Thermography
Introduction
Chen Ding is a notable inventor based in Shijiazhuang, China. He has made significant contributions to the field of thermoreflectance thermography, particularly through his innovative methods for displacement compensation. His work is characterized by a blend of advanced technology and practical applications.
Latest Patents
Chen Ding holds a patent for a "Three-dimensional displacement compensation method for microscopic thermoreflectance thermography and control device." This patent outlines a comprehensive method that includes several steps: obtaining a current image of a measured element, transforming the image using Fourier transforms, determining peak point coordinates, calculating three-dimensional displacements, and compensating for these displacements. This innovative approach enhances the accuracy and effectiveness of thermographic measurements.
Career Highlights
Chen Ding is affiliated with the 13th Research Institute of China Electronics Technology Group Corporation. His role at this esteemed institution allows him to work on cutting-edge technologies and contribute to advancements in electronic measurement techniques. His expertise in thermoreflectance thermography has positioned him as a key figure in this specialized field.
Collaborations
Chen has collaborated with notable colleagues, including Hao Li and Xiaodong Jing. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
In summary, Chen Ding is a distinguished inventor whose work in thermoreflectance thermography has led to significant advancements in the field. His innovative methods and collaborative spirit continue to inspire progress in electronic measurement technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile