Chu-Pei, Taiwan

Chen-Ching Chen

This inventor holds 1 USPTO granted patent. Top assignee: Mpi Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chen-Ching Chen. Retrieved from https://idiyas.com/inventor/chen-ching-chen-1f02hi65

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Chen-Ching Chen

Introduction

Chen-Ching Chen is a notable inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of probe technology, particularly with his innovative methods for compensating probe misplacement. His work is essential for enhancing the accuracy and efficiency of probe modules used in various applications.

Latest Patents

Chen-Ching Chen holds a patent for a "Method for compensating probe misplacement and probe apparatus." This invention provides a method applicable to a probe module that includes a probe and a fixing base. The probe consists of a probe body section and a probe tip section, with the probe body section fixed on the fixing base. The method involves measuring the temperature of the probe body, calculating the thermal expansion amount along the length direction of the probe body section, and determining a compensation value. This allows for precise alignment of the probe tip with the to-be-tested element, ensuring accurate measurements.

Career Highlights

Chen-Ching Chen is currently associated with Mpi Corporation, where he continues to develop innovative solutions in probe technology. His expertise and dedication to his work have made him a valuable asset to the company.

Collaborations

Chen-Ching Chen collaborates with talented individuals such as Yu-Hsun Hsu and Po-Yi Ting, who contribute to the innovative environment at Mpi Corporation.

Conclusion

Chen-Ching Chen's contributions to probe technology through his patented methods demonstrate his commitment to innovation and excellence in his field. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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