Charlie Hwang

Title: Innovations by Charlie Hwang in Noise Measurement Technology

Introduction

Charlie Hwang is an accomplished inventor based in Santa Clara, CA. She has made significant contributions to the field of semiconductor technology, particularly in noise measurement techniques. Her innovative approach has the potential to enhance the reliability of chip testing processes.

Latest Patents

Charlie Hwang holds a patent for a technique titled "Technique for enabling on-die noise measurement during ATE testing and IST." This patent introduces a method that reliably measures on-die noise of logic within a chip. The technique strategically places a noise measurement system in chip partitions that are expected to generate the most noise. By utilizing a continuous free-running clock, the system feeds functional frequency to the noise measurement circuit throughout the noise measurement scan test. This advancement allows for the measurement of voltage noise during a shift phase, which was previously unattainable with conventional methods. The comprehensive noise measurement can be performed not only during ATE testing but also as part of IST in the field.

Career Highlights

Charlie Hwang is currently employed at Nvidia Corporation, where she continues to push the boundaries of innovation in semiconductor technology. Her work has been instrumental in developing techniques that improve the accuracy and efficiency of chip testing.

Conclusion

Charlie Hwang's contributions to noise measurement technology represent a significant advancement in the semiconductor industry. Her innovative techniques are set to enhance the reliability of chip testing processes, making a lasting impact on the field.