Location History:
- Milwaukie, OR (US) (2004)
- Portland, OR (US) (1992 - 2006)
Company Filing History:
10 out of 65 
1 out of 832,891 Years Active: 1992-2006
Title: The Innovations of Charles W. Schietinger
Introduction
Charles W. Schietinger is a notable inventor based in Portland, Oregon, with a remarkable portfolio of 11 patents. His work primarily focuses on optical techniques for measuring layer thicknesses and surface characteristics of various objects, including semiconductor wafers. Schietinger's innovative approaches have significantly contributed to advancements in the field of optical measurement.
Latest Patents
One of Schietinger's latest patents involves a method for measuring surface characteristics by illuminating the surface with optical radiation over a wide angle. This technique allows for the reception of reflected radiation at an angle that depends on the extent of the illumination angle. By measuring emissivity and reflectivity, the accuracy of the measurements is enhanced. This method is particularly useful for determining the thickness of layers made of transparent materials or metals. The use of one or multiple wavelength techniques enables precise measurements, while noise from ambient radiation is minimized by modulating the radiation source at a frequency where such noise is negligible. This innovation is crucial for in situ monitoring of film thickness reduction during processes like chemical-mechanical polishing (CMP).
Career Highlights
Throughout his career, Schietinger has made significant contributions to the field of optical measurement. His work has been instrumental in improving the precision of measurements in semiconductor processing and flat panel display manufacturing. His innovative techniques have paved the way for enhanced control during the processing of various articles.
Collaborations
Schietinger has collaborated with notable professionals in his field, including Bruce E. Adams and Anh Ngoc Hoang. These collaborations have further enriched his work and contributed to the development of advanced optical measurement techniques.
Conclusion
Charles W. Schietinger's contributions to optical measurement technology have had a profound impact on various industries, particularly in semiconductor processing. His innovative patents and collaborative efforts continue to influence advancements in this critical field.