Hampton, United Kingdom

Charles Dean Mallah

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Buhler Sortex Limited. Active years: 2016.


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Charles Dean Mallah: Innovator in Inspection Technology

Introduction

Charles Dean Mallah is a notable inventor based in Hampton, GB. He has made significant contributions to the field of inspection technology, particularly through his innovative patent that utilizes pattern recognition.

Latest Patents

Mallah holds a patent for an "Inspection apparatus and method using pattern recognition." This inspection apparatus comprises a feed system designed to deliver a stream of articles to an imaging zone. A camera generates image data from the stream at the imaging zone for processing by a computer. The computer features a pattern recognition system that identifies defects in areas from the image data and ranks the identified defects. The pattern recognition system is programmed to operate according to multiple defect criteria. Additionally, the computer is coupled to a graphical user interface that displays the areas identified from the image data as thumbnails, arranged according to the rank of the identified defects in each of at least two defect criteria. The areas defined around each identified defect typically have the defect centered within them, and these areas or thumbnails can overlap.

Career Highlights

Mallah is currently associated with Buhler Sortex Limited, where he applies his expertise in inspection technology. His work has contributed to advancements in the efficiency and accuracy of defect detection in various applications.

Collaborations

Mallah collaborates with Gabriel Hamid, enhancing the innovative capabilities within their field.

Conclusion

Charles Dean Mallah's contributions to inspection technology through his patent demonstrate his commitment to innovation and excellence in the industry. His work continues to influence the way defects are identified and ranked, showcasing the importance of pattern recognition in modern technology.

Profile summary based on public USPTO records.
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