The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2016
Filed:
Jul. 05, 2010
Gabriel Hamid, Loughton, GB;
Charles Dean Mallah, Hampton, GB;
Gabriel Hamid, Loughton, GB;
Charles Dean Mallah, Hampton, GB;
BUHLER SORTEX LTD., London, GB;
Abstract
Inspection apparatus comprises a feed system for delivering a stream of articles to an imaging zone. A camera generates image data from the stream at the imaging zone for processing by a computer. The computer comprises a pattern recognition system for identifying defects in areas from the image data, and for ranking identified defects. The pattern recognition system is programmed to operate according to multiple defect criteria. The computer is also coupled to a graphical user interface to display the areas identified from the image data as thumbnails on the interface arranged according to rank of the identified defects in the areas, in each of at least two defect criteria. The areas from the generated image data will normally be defined around each identified defect with the defect central therein. These areas, or thumbnails, can overlap.