This inventor holds 1 USPTO granted patent. Top assignee: Kla Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Innovations by Chaoqing Wang in Defect Detection Technology
Introduction
Chaoqing Wang is a notable inventor based in Shanghai, China. He has made significant contributions to the field of defect detection technology. His innovative work has led to the development of a patent that addresses critical challenges in inspecting array regions on specimens.
Latest Patents
Chaoqing Wang holds a patent for "Detecting defects in array regions on specimens." This patent outlines methods and systems for detecting defects in an array region on a specimen. One of the key features of his system includes an inspection subsystem that generates output responsive to patterned features formed in the array region. Additionally, a computer subsystem determines if the pitch of the patterned features is an integer of pixels in the detector. If the pitch is not an integer, the system interpolates the output to generate a modified pitch that is an integer of the pixels. This innovative approach allows for effective defect detection in the array region.
Career Highlights
Chaoqing Wang is currently associated with Kla Corporation, where he applies his expertise in defect detection technology. His work at Kla Corporation has positioned him as a valuable asset in the field of innovation.
Collaborations
Chaoqing Wang collaborates with talented individuals such as Siqing Nie and Chunwei Song. Their combined efforts contribute to advancing technology in their respective fields.
Conclusion
Chaoqing Wang's contributions to defect detection technology exemplify the impact of innovative thinking in solving complex problems. His patent and work at Kla Corporation highlight his role as a leading inventor in this domain.