This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Innovations by Chao-Hao Cheng in Integrated Circuit Testing
Introduction
Chao-Hao Cheng is a notable inventor based in Jungli, Taiwan. He has made significant contributions to the field of integrated circuit testing, particularly in methods that enhance the reliability of these circuits. His work is essential for ensuring the durability and performance of semiconductor devices.
Latest Patents
Chao-Hao Cheng holds a patent for a "Method and apparatus for stress testing integrated circuits using an adjustable AC hot carrier injection source." This innovative method provides a system for stress testing integrated circuits to assess their vulnerability to hot carrier charge injection damage. The apparatus includes a hot carrier injection source on a semiconductor wafer that carries the integrated circuits under examination. It features a voltage-controlled oscillator that generates a variable frequency AC output test signal, along with a modulator circuit that adjusts the duty cycle of the test signal applied to the integrated circuits.
Career Highlights
Chao-Hao Cheng is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His expertise in integrated circuit testing has positioned him as a valuable asset to the company. His work not only contributes to the advancement of technology but also enhances the reliability of electronic devices used in various applications.
Collaborations
Chao-Hao Cheng has collaborated with esteemed colleagues such as Chien-Jung Wang and Shih-Liang Wang. These partnerships have fostered a productive environment for innovation and have led to advancements in the field of semiconductor technology.
Conclusion
Chao-Hao Cheng's contributions to integrated circuit testing through his innovative patent demonstrate his commitment to enhancing the reliability of semiconductor devices. His work continues to impact the industry positively, ensuring that electronic devices perform optimally in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile