Chanwoo Park

Title: Chanwoo Park - Innovator in Wafer Defect Estimation

Introduction

Chanwoo Park is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in the estimation of defects in wafers. His innovative approach utilizes advanced techniques to enhance the accuracy of defect measurement.

Latest Patents

Chanwoo Park holds a patent for a method titled "Estimating heights of defects in a wafer by scaling a 3D model using an artificial neural network." This patent describes a comprehensive method for estimating the heights of defects in a wafer. The process involves creating an un-calibrated 3D model of a defect based on multiple Scanning Electron Microscope (SEM) images. It further includes transforming this un-calibrated model into a calibrated version and estimating the defect's height using the calibrated model. This innovative method significantly improves the precision of defect analysis in semiconductor manufacturing.

Career Highlights

Chanwoo Park is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work at Samsung has allowed him to apply his expertise in semiconductor technology and contribute to the company's advancements in this field. With a focus on innovation, he continues to push the boundaries of what is possible in wafer defect estimation.

Collaborations

Chanwoo has collaborated with talented individuals such as Shashank Shrikant Agashe and Gaurav Kumar. These collaborations have fostered a creative environment that encourages the exchange of ideas and enhances the development of innovative solutions.

Conclusion

Chanwoo Park is a distinguished inventor whose work in wafer defect estimation has made a significant impact in the semiconductor industry. His innovative methods and collaborations with other experts highlight his commitment to advancing technology. His contributions continue to shape the future of semiconductor manufacturing.