Chan Gi Jeon

Title: Innovations by Chan Gi Jeon in Semiconductor Technology

Introduction

Chan Gi Jeon is a notable inventor based in Hwaseong-si, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in the area of wafer inspection. His innovative methods have the potential to enhance the efficiency and accuracy of semiconductor device fabrication.

Latest Patents

Chan Gi Jeon holds a patent for a "Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the same." This patent outlines a comprehensive semiconductor wafer inspection method that includes several key steps. The process involves providing a wafer with target and reference dies, obtaining candidate and reference images, and performing imaging processes to achieve high-resolution images. The method ultimately detects defect signals based on the differences between these images, which is crucial for ensuring the quality of semiconductor devices.

Career Highlights

Throughout his career, Chan Gi Jeon has worked with prominent organizations, including Samsung Electronics Co., Ltd. and Korea University Research and Business Foundation. His experience in these institutions has allowed him to develop and refine his innovative approaches to semiconductor technology.

Collaborations

Chan Gi Jeon has collaborated with several talented individuals in his field, including Q-Han Park and Sung Yoon Ryu. These collaborations have contributed to the advancement of semiconductor inspection methods and have fostered a productive exchange of ideas.

Conclusion

Chan Gi Jeon's contributions to semiconductor technology, particularly through his patented methods, highlight his role as an influential inventor in the industry. His work continues to impact the efficiency of semiconductor device fabrication, showcasing the importance of innovation in this critical field.