Bengaluru, India

Chaitanya Kancherla


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

where 'Filed Patents' based on already Granted Patents

1 patent (USPTO):

Title: Chaitanya Kancherla: Innovator in Temporal Order Verification

Introduction

Chaitanya Kancherla is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of technology, particularly in the area of verifying the order of entities processed by devices. His innovative approach has led to the development of a unique patent that addresses critical challenges in device testing.

Latest Patents

Chaitanya holds a patent for a mechanism that creates randomly ordered fields while maintaining the temporal ordering based on the value of the fields. This invention provides a method for verifying the order of entities being processed by a device under test (DUT). The mechanism involves arranging entities into a temporal order and encoding them to maintain this order while producing encoded entities with random values. Each encoded entity has a one-to-one mapping to its corresponding entity in the temporal order. This process is crucial for verifying the DUT's output, especially when errors are detected.

Career Highlights

Chaitanya is currently employed at International Business Machines Corporation (IBM), where he continues to innovate and contribute to advancements in technology. His work focuses on enhancing the reliability and efficiency of device testing processes.

Collaborations

Chaitanya collaborates with talented professionals in his field, including coworkers Clinton E Bubb and Roopesh Ambalath Matayambath. Their combined expertise fosters a creative environment that drives innovation.

Conclusion

Chaitanya Kancherla's contributions to the field of technology through his patent and work at IBM highlight his role as a significant inventor. His innovative solutions are paving the way for improved device testing methodologies.

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