The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

May. 16, 2011
Applicants:

Clinton E. Bubb, Pleasant Valley, NY (US);

Chaitanya Kancherla, Bangalore, IN;

Roopesh A. Matayambath, Bangalore, IN;

Ralf Winkelmann, Holzgerlingen, DE;

Inventors:

Clinton E. Bubb, Pleasant Valley, NY (US);

Chaitanya Kancherla, Bangalore, IN;

Roopesh A. Matayambath, Bangalore, IN;

Ralf Winkelmann, Holzgerlingen, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mechanism for verifying order of entities being processed by a device under test (DUT) is provided. The mechanism includes arranging the entities into a temporal order, and encoding the entities to maintain the temporal order of the entities and produce encoded entities with each being a random value. The encoded entities each have a one-to-one mapping to their corresponding one of the entities in the temporal order. The encoded entities are input into the DUT to verify its output, and responsive to detecting an error in the output corresponding to one encoded entity, the one encoded entity is decoded into a current decoded error entity. It is determined which is lower in the temporal order between the current decoded error entity and a previous decoded error entity. Responsive to the current decoded error entity being lower than the previous decoded error entity, the current decoded error entity is stored.


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