This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Technologies Corporation. Active years: 2007.
Company Filing History:
Years Active: 2007
Title: Chacko C Neroth: Innovator in Defect Image Analysis
Introduction
Chacko C Neroth is a notable inventor based in Sunnyvale, CA (US). He has made significant contributions to the field of defect image analysis, particularly in the semiconductor industry. His innovative approach has led to the development of a unique patent that enhances the efficiency of analyzing defect images.
Latest Patents
Chacko C Neroth holds a patent for an "Apparatus and methods for searching through and analyzing defect images and wafer maps." This invention discloses methods and apparatus for automatically organizing and analyzing a plurality of defect images without the need for a predefined set of classified images. The patent emphasizes sorting defect images based on associated identifying data, such as fabrication identifiers and lot numbers, rather than relying on a training set. This method allows for efficient searching of images that resemble a specified target image by comparing feature vectors.
Career Highlights
Chacko C Neroth is associated with Kla-Tencor Technologies Corporation, where he has been instrumental in advancing technologies related to defect image analysis. His work has contributed to improving the accuracy and efficiency of defect detection in semiconductor manufacturing processes.
Collaborations
Chacko has collaborated with notable colleagues, including David R Bakker and James L Belliveau. Their combined expertise has furthered the development of innovative solutions in the field.
Conclusion
Chacko C Neroth's contributions to defect image analysis through his patent demonstrate his commitment to innovation in the semiconductor industry. His work continues to influence the way defect images are analyzed and organized, paving the way for advancements in manufacturing processes.