This inventor holds 1 USPTO granted patent. Top assignee: Saint-Gobain Centre De Recherches Et D'etudes Europeen. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Cédric Payan: Inventor in Reflectometry-Based Monitoring
Introduction
Cédric Payan is an inventor based in Cavaillon, France. His patent work concerns electrical reflectometry, a technique for monitoring components by analyzing signals reflected through a waveguide.
Latest Patents
Payan is associated with 1 patent: “Device and Method for Monitoring a Target Component or a Set of Target Components Through Electrical Time-Domain or Frequency-Domain Reflectometry.” The invention describes a device that injects an incident signal into an electromagnetic waveguide and receives a reflected signal. Its measuring section contains randomly distributed base discontinuities that generate echoes with amplitudes greater than 1% and less than 30% of the background echo. These echoes support monitoring of a target component or set of components.
Career Highlights
Payan is associated with Saint-Gobain Centre de Recherches et d’Études Européen. His patent reflects work on applying time-domain or frequency-domain reflectometry to component monitoring.
Collaborations
Mickaël Boinet is identified as Payan’s coworker. The available information does not specify their particular projects or contributions to the patent.
Conclusion
Cédric Payan’s patent focuses on using controlled waveguide echoes to monitor target components through electrical reflectometry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile