The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Sep. 29, 2022
Applicant:

Saint-gobain Centre DE Recherches ET D'etudes Europeen, Courbevoie, FR;

Inventors:

Mickael Boinet, Cavaillon, FR;

Vincent Gleize, Cavaillon, FR;

Cédric Payan, Cavaillon, FR;

Céline Skora, Cavaillon, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/12 (2006.01); G01N 22/00 (2006.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01V 3/12 (2013.01); G01N 22/00 (2013.01); G01N 27/02 (2013.01);
Abstract

A device for tracking a target component through electrical time-domain or frequency-domain reflectometry has an electromagnetic waveguide and an interrogator electrically connected to the waveguide in order to inject an incident signal therein and receive a reflected signal in response. The reflected signal has a background echo reflected by the exit end of the waveguide. The waveguide has a measuring part with a plurality of base discontinuities, distributed randomly along the measuring part of the waveguide, and that are able to generate echoes having an amplitude greater than 1% and less than 30% of the amplitude of the background echo.


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Boinet, Mickael. (2026). Device and method for monitoring a target component or a set of target components through electrical time-domain or frequency-domain reflectometry (U.S. Patent No. 12736702). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12736702

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