Company Filing History:
Years Active: 2004-2009
Title: Cedric Affentauschegg: Innovator in Semiconductor Inspection Technology
Introduction
Cedric Affentauschegg is a notable inventor based in San Jose, California. He has made significant contributions to the field of semiconductor inspection technology. With a total of 2 patents, his work focuses on enhancing the precision and efficiency of in-line inspection systems.
Latest Patents
One of Cedric's latest patents is a "Copper CMP flatness monitor using grazing incidence interferometry." This innovative system provides a method for in-line inspection of specimens, such as semiconductor wafers. The system utilizes a diffraction grating that widens and passes nth order (n>0) wave fronts to the specimen surface. A reflective surface is employed for the transmitted light beam, allowing light energy to be transmitted in a narrow swath across the portion of the surface with standardized features. The wavefronts are then combined using a second diffraction grating and passed to a camera system with a desired aspect ratio.
Career Highlights
Cedric Affentauschegg is currently employed at KLA-Tencor Technologies Corporation, where he continues to develop cutting-edge technologies in semiconductor inspection. His work has been instrumental in advancing the capabilities of in-line inspection systems, making them more reliable and efficient.
Collaborations
Throughout his career, Cedric has collaborated with esteemed colleagues, including Dieter Mueller and George J. Kren. These partnerships have fostered innovation and contributed to the success of various projects within the semiconductor industry.
Conclusion
Cedric Affentauschegg stands out as a key figure in the realm of semiconductor inspection technology. His innovative patents and contributions to KLA-Tencor Technologies Corporation highlight his commitment to advancing the field. Cedric's work continues to impact the industry positively, paving the way for future innovations.