This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Visa International Service Association. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Cecilia Yusman: Innovator in Dynamic Testing Frameworks
Introduction
Cecilia Yusman is a notable inventor based in Singapore, recognized for her contributions to the field of dynamic applicability management in testing frameworks. With a focus on enhancing the efficiency of testing procedures, her work has significant implications for the development and evaluation of computing devices.
Latest Patents
Cecilia holds a patent for a "Testing framework with dynamic applicability management." This invention encompasses systems, methods, and devices designed to provide dynamic applicability management concerning a testing framework. The patent details how executable code segments can be integrated into various test procedures, which include instructions for testing hardware, software, capabilities, features, functionalities, or protocols of a computing device. Each code segment encapsulates logic that identifies whether a corresponding test procedure is applicable to a device based on its configuration. By executing these code segments, a set of applicable test procedures can be identified, facilitating a more streamlined testing process.
Career Highlights
Cecilia is currently employed at Visa International Service Association, where she applies her expertise in testing frameworks to enhance the company's technological capabilities. Her innovative approach has contributed to the development of more effective testing methodologies within the organization.
Collaborations
Cecilia collaborates with talented individuals such as Jin Xu and Kiat Chun Tan, who share her commitment to advancing technology through innovative solutions.
Conclusion
Cecilia Yusman's work in dynamic applicability management represents a significant advancement in testing frameworks, showcasing her dedication to innovation in technology. Her contributions continue to influence the field and improve the efficiency of testing processes in computing devices.