The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
May. 05, 2023
Visa International Service Association, San Francisco, CA (US);
Yuexi Chen, Foster City, CA (US);
Marc Kekicheff, Foster City, CA (US);
Jin Xu, Singapore, SG;
Cecilia Yusman, Singapore, SG;
Kiat Chun Tan, Singapore, SG;
VISA INTERNATIONAL SERVICE ASSOCIATION, San Francisco, CA (US);
Abstract
Embodiments of the invention are directed to systems, methods, and devices for providing dynamic applicability management with respect to a testing framework. Executable code segments can be provided in/with various test procedures that include instructions for testing hardware, software, capabilities, features, functionalities, or protocols of a computing device. Each code segment can encapsulate logic that, when executed, identifies whether a corresponding test procedure is applicable to a device given that device's configuration. By executing each code segment, a set of applicable test procedures can be identified. Identifiers or the test procedures may be provided to the device to be tested or a testing platform configured to conduct the test of that device. Transmitting the identifiers and/or procedures configures those devices to perform the test through simulating a legitimate data exchange.