Cecilia T Chen

Title: Cecilia T Chen: Innovator in Integrated Circuit Testing

Introduction

Cecilia T Chen is a prominent inventor based in Alameda, CA (US). She has made significant contributions to the field of integrated circuit testing, showcasing her expertise through her innovative patent.

Latest Patents

Cecilia holds a patent for a "System and method for testing operational transmissions of an integrated circuit." This invention introduces a source synchronous test methodology and apparatus. In one embodiment, an integrated circuit (IC) configured for source synchronous I/O transactions may serve as a device under test (DUT) and can be mounted to a load board for testing. The load board is electrically coupled to a test system, which shifts first test data into a first IC on the load board. The first chip transmits the first test data through a source synchronous line to a second IC. The second test data produced in response to the source synchronous transmission is then shifted from the second IC to the tester for analysis. This analysis may involve comparing the second data to expected data and analyzing it with respect to an eye window. Cecilia has 1 patent to her name.

Career Highlights

Cecilia T Chen has established herself as a key figure in her field, working at Sun Microsystems, Inc. Her role at the company has allowed her to develop and refine her innovative ideas, contributing to advancements in integrated circuit technology.

Collaborations

Cecilia has collaborated with notable colleagues, including Jyh-Ming Jong and Wai Fong. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Cecilia T Chen is a remarkable inventor whose work in integrated circuit testing has made a lasting impact on the industry. Her innovative patent and collaborations highlight her dedication to advancing technology.