Richardson, TX, United States of America

Catherine Beth Vartuli

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Catherine Beth Vartuli. Retrieved from https://idiyas.com/inventor/catherine-beth-vartuli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Catherine Beth Vartuli: Innovator in Strain Measurement Technology

Introduction

Catherine Beth Vartuli is a notable inventor based in Richardson, TX (US). She has made significant contributions to the field of semiconductor technology, particularly in the measurement of strain in transistors. Her innovative work has implications for improving transistor performance, which is crucial in various electronic applications.

Latest Patents

Catherine holds a patent for a "Strain measurement test module." This invention is a test structure designed for measuring strain in the channel of transistors. It also includes a method for correlating transistor performance with channel strain. This patent highlights her expertise and commitment to advancing technology in the semiconductor industry.

Career Highlights

Catherine is currently employed at Texas Instruments Corporation, a leading company in the field of electronics and semiconductor manufacturing. Her role at Texas Instruments allows her to apply her innovative ideas and contribute to the development of cutting-edge technologies.

Collaborations

Throughout her career, Catherine has collaborated with talented individuals such as Jayhoon Chung and Guoda Lian. These collaborations have likely enriched her work and fostered an environment of innovation and creativity.

Conclusion

Catherine Beth Vartuli is a pioneering inventor whose work in strain measurement technology is making a significant impact in the semiconductor industry. Her contributions are essential for the advancement of transistor performance and electronic applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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