Gerlingen, Germany

Carsten Suess

This inventor holds 1 USPTO granted patent. Top assignee: Agilent Technologies, Inc.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Carsten Suess. Retrieved from https://idiyas.com/inventor/carsten-suess

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 63(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Carsten Suess and Optical Component Testing.

Introduction

Carsten Suess is an inventor associated with Gerlingen, Germany, and Agilent Technologies, Inc. His patent work concerns testing optical components and measuring how their characteristics vary with wavelength.

Latest Patents

The available information lists one patent for Suess: Optical Component Tester. The invention describes a tester that determines the wavelength-dependent characteristics of an optical component. A tunable laser source provides a stimulus signal, while one or more response units receive the component’s response. A control unit coordinates the functional units and preferably includes a microcontroller connected to a signal processor, which handles timing-critical operations. Suess is credited with 1 patent.

Career Highlights

Suess is associated with Agilent Technologies, Inc. The listed patent reflects work on coordinating optical test signals, response measurements, and control functions in a single testing system.

Collaborations

The provided information names Edgar Leckel and Helmut Sennewald as Suess’s coworkers. Their specific contributions to the optical component tester are not detailed in the available description.

Conclusion

Carsten Suess’s listed invention focuses on a controlled, wavelength-sensitive approach to testing optical components, combining a tunable laser source, response units, and signal-processing functions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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