The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2003

Filed:

Apr. 20, 1999
Applicant:
Inventors:

Edgar Leckel, Jettingen, DE;

Helmut Sennewald, Herrenberg, DE;

Carsten Suess, Gerlingen, DE;

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/008 ;
U.S. Cl.
CPC ...
H04B 1/008 ;
Abstract

Disclosed is an optical component tester for determining the wavelength dependent characteristics of an optical component. The tester comprises as functional units a tunable laser source for providing a stimulus signal to the optical component and one or more response units for receiving a response of the optical component on the stimulus signal; The tester further comprises a control unit coupled to the functional units for controlling the functioning thereof. The control unit preferably comprises a microcontroller connected to a signal processor, whereby the signal processor is connected to the functional units and responsible for processing all timing critical operations within the tester.


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