This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Qualtrics, LLC. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Carol Sue Haney: Innovator in Anomaly Detection
Introduction
Carol Sue Haney is a prominent inventor based in Chicago, IL (US). She has made significant contributions to the field of data analysis, particularly in the area of anomaly detection. With a focus on innovative solutions, Haney has developed a patented technology that enhances the accuracy of data monitoring.
Latest Patents
Haney holds a patent for "Detecting and validating anomalies from ongoing data collection." This invention relates to systems, non-transitory computer-readable media, and methods for detecting and validating anomalies from ongoing data collection by applying an algorithm corresponding to a data pattern of the ongoing data collection. The disclosed systems utilize a time series classification model to identify data patterns and monitor ongoing data collection for potential anomalies. Furthermore, the systems include an anomaly validation filter to eliminate false positives, ensuring reliable data analysis.
Career Highlights
Currently, Carol Sue Haney is employed at Qualtrics, LLC, where she continues to innovate in the field of data collection and analysis. Her work has positioned her as a key player in developing advanced methodologies for data integrity and anomaly detection.
Collaborations
Some of her notable coworkers include Grzegorz Chlebus and Przemyslaw Franciszek Simajchel, who contribute to the collaborative environment at Qualtrics, LLC.
Conclusion
Carol Sue Haney's contributions to anomaly detection through her patented technology exemplify her commitment to innovation in data analysis. Her work not only enhances the reliability of data collection but also sets a standard for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
