The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jun. 23, 2023
Qualtrics, Llc, Provo, UT (US);
Grzegorz Chlebus, Cracow, PL;
Carol Sue Haney, Chicago, IL (US);
Przemyslaw Franciszek Simajchel, Cracow, PL;
Maksym Titov, Cracow, PL;
Recep Colak, Seattle, WA (US);
Kamil Surmacz, Cracow, PL;
Dominik Franciszek Schaefer, Adliswil, CH;
Szymon Wladyslaw Jachim, Cracow, PL;
Qualtrics, LLC, Provo, UT (US);
Abstract
The present disclosure relates to systems, non-transitory computer-readable media, and methods for detecting and validating anomalies from an ongoing data collection by applying an algorithm corresponding to a data pattern of the ongoing data collection. In particular, in one or more embodiments, the disclosed systems utilize a time series classification model to identify a data pattern corresponding to the ongoing data collection. Further, the disclosed systems can utilize an algorithm corresponding to the data pattern to monitor the ongoing data collection for anomaly candidates. Additionally, in one or more embodiments, the disclosed systems pass anomaly candidates through an anomaly validation filter to remove false positives.