Austin, TX, United States of America

Carlos J Cabral

This inventor holds 1 USPTO granted patent. Top assignee: Freescale Semiconductor,inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Carlos J Cabral. Retrieved from https://idiyas.com/inventor/carlos-j-cabral

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: The Innovations of Carlos J Cabral

Introduction

Carlos J Cabral is an accomplished inventor based in Austin, TX. He has made significant contributions to the field of performance monitoring through his innovative patent. His work is recognized for its practical applications in technology and engineering.

Latest Patents

Carlos holds a patent for a "Performance monitor and method therefor." This invention relates to a monitoring unit and method that counts a number of qualified clusters of a selected event type based on specific thresholds. The patent outlines a method where a qualified cluster is detected and counted if it meets both size and granularity thresholds, and occurs after a defined distance threshold time from a previous cluster. This innovative approach enhances the efficiency of performance monitoring systems.

Career Highlights

Carlos J Cabral is currently employed at Freescale Semiconductor, Inc., where he applies his expertise in developing advanced monitoring solutions. His work at Freescale has positioned him as a key contributor to the company's technological advancements.

Collaborations

Carlos collaborates with his coworker, Jose Melanio Nunez, to further enhance their projects and drive innovation within their team.

Conclusion

Carlos J Cabral's contributions to performance monitoring through his patent demonstrate his commitment to innovation and technology. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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