The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Sep. 26, 2002
Carlos J. Cabral, Austin, TX (US);
Jose M. Nunez, Austin, TX (US);
Carlos J. Cabral, Austin, TX (US);
Jose M. Nunez, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
Embodiments of the present invention relate generally to a monitoring unit and method which counts a number of qualified clusters of a selected event type based on a size threshold, granularity threshold, and distance threshold time. In one embodiment, a qualified cluster is a cluster which meets both the size threshold and granularity threshold. In one embodiment, a qualified cluster is detected and counted by the cluster counter if it occurs at least the distance threshold time after a previous counted qualified cluster. For example, in one implementation, the performance monitor waits until a distance threshold time expires prior to detecting a next qualified cluster. Alternatively, all qualified clusters are detected where the cluster counter counts a qualified cluster only if it occurs at least the distance threshold time after a previous qualified cluster, regardless of whether it was counted by the cluster counter or not.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile