This inventor holds 1 USPTO granted patent. Top assignee: The Board of Regents of the University of Nebraska. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: The Innovations of Carlo Waldfried
Introduction
Carlo Waldfried is an accomplished inventor based in Arlington, VA (US). He has made significant contributions to the field of charged particle detection technology. His innovative work has led to the development of a unique system that enhances the resolution of particle-energy detection.
Latest Patents
Waldfried holds a patent for a "High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use." This invention discloses a compact and small diameter system that allows for high-resolution detection of charged particles. The design incorporates multiple sequential stages, which improve detection resolution compared to single-stage systems. The compact size of the analyzer enables it to be positioned effectively using a manipulator attached to a linear motion feedthrough mounted on a vacuum system's conflat flange.
Career Highlights
Carlo Waldfried is associated with the Board of Regents of the University of Nebraska, where he contributes to research and development in advanced detection systems. His work is recognized for its innovative approach and practical applications in various scientific fields.
Collaborations
Waldfried has collaborated with notable colleagues, including Peter A. Dowben and David N. McIlroy. Their combined expertise has furthered advancements in the technology surrounding charged particle detection.
Conclusion
Carlo Waldfried's contributions to the field of charged particle detection exemplify the impact of innovative thinking in scientific research. His patented technology represents a significant advancement in the capabilities of detection systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
