Newark, DE, United States of America

Can Chen

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Can Chen. Retrieved from https://idiyas.com/inventor/can-chen-vv8qov9a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Can Chen

Introduction

Can Chen is a notable inventor based in Newark, DE (US). He has made significant contributions to the field of digital image forensics. His work focuses on enhancing the integrity of digital images through innovative technological solutions.

Latest Patents

Can Chen holds a patent for a system titled "Determining image forensics using gradient statistics at edges." This patent involves a method for assessing the integrity of a digital image by detecting edges within the image. The system defines a patch of pixels that encompasses the edge and generates data related to intensity and gradient magnitude for those pixels. By analyzing this data, the system can determine whether the digital image has been forged or remains unaltered. This innovative approach is crucial in the fight against digital image manipulation.

Career Highlights

Can Chen is currently employed at Honeywell International Inc., where he continues to develop cutting-edge technologies. His work at Honeywell has allowed him to collaborate with other talented professionals in the field. One of his notable coworkers is Scott McCloskey, with whom he shares insights and expertise.

Collaborations

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Conclusion

Can Chen's contributions to digital image forensics exemplify the importance of innovation in technology. His patent reflects a commitment to enhancing image integrity and combating forgery. His work at Honeywell International Inc. continues to pave the way for advancements in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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