The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Feb. 16, 2017
Applicant:
Honeywell International Inc., Morris Plains, NJ (US);
Inventors:
Can Chen, Newark, DE (US);
Scott McCloskey, Minneapolis, MN (US);
Assignee:
Honeywell International Inc., Morris Plains, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06N 3/08 (2006.01); G06K 9/46 (2006.01); G06N 20/10 (2019.01); G06N 3/04 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06K 9/4604 (2013.01); G06K 9/4642 (2013.01); G06N 3/0454 (2013.01); G06N 20/10 (2019.01); G06K 9/6269 (2013.01);
Abstract
A system assesses the integrity of a digital image by detecting an edge in the digital image and defining a patch of pixels encompassing the edge. The system then generates data relating to intensity and gradient magnitude for pixels in the patch, analyzes the data relating to intensity and gradient magnitude, and determines that the digital image has been forged or the digital image has not been forged based on the analysis of the data relating to intensity and gradient magnitude.