C W Eifrig

Title: C W Eifrig: Innovator in LSI Fault Insertion Technology

Introduction

C W Eifrig is a notable inventor based in Framingham, MA (US). He has made significant contributions to the field of large scale integrated (LSI) circuits. His innovative work focuses on enhancing the testing capabilities of these complex devices.

Latest Patents

C W Eifrig holds a patent for an apparatus and method for providing programmable fault insertion circuitry in LSI circuit devices. This invention eliminates the need for external switches or relays to create faults. A fault parameter word is stored in a register, and the outputs of the register are decoded to select the fault condition to be inserted by an interfacing circuit to the logic being tested. Test vectors and the fault parameter word are generated by a controller coupled to the integrated circuit, and a test response from the integrated circuit is examined by the controller. This patent showcases his expertise in improving the reliability and efficiency of LSI circuits.

Career Highlights

C W Eifrig is associated with Raytheon Company, where he applies his skills in circuit design and testing. His work has contributed to advancements in the field of electronics and has had a lasting impact on the industry.

Collaborations

Throughout his career, C W Eifrig has collaborated with talented individuals such as James K Mathewes, Jr and Jan S Herman. These collaborations have fostered innovation and have led to the development of cutting-edge technologies.

Conclusion

C W Eifrig's contributions to LSI fault insertion technology highlight his role as a key innovator in the electronics industry. His patent and collaborations reflect his commitment to advancing technology and improving testing methodologies.