Raytheon Company

C W Eifrig

H Frank Howes

James K Mathewes, Jr

Jan S Herman

Charles O Schulz

Apparatus and method for providing programmable fault insertion circuitry in a large scale integrated (LSI) circuit device thereby eliminating the need for external switches or relays to create faults. A fault parameter word is stored in a register and the outputs of the register are decoded to select the fault condition to be inserted by an interfacing circuit to the logic being tested. Test vectors and the fault parameter word are generated by a controller coupled to the integrated circuit and a test response from the integrated circuit is examined by the controller.

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Framingham, MA, United States of America

C W Eifrig