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For the Inventor, By the Inventor

Boise, ID, United States of America

C Patrick Doherty

This inventor holds 15 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 2000-2007.

USPTO Granted Patents = 15

% Patents Active = 60.0

Average Co-Inventor Count = 3.7

ph-index = 12

Forward Citations = 588(Granted Patents)


Company Filing History:

goldMedal15 out of 39,149 
 
Micron Technology Incorporated
 patents

Years Active: 2000-2007

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15 patents (USPTO):Explore Patents
1. 7250780 - Probe card for semiconductor wafers having mounting plate and socket (2007-07-31),
2. 6853211 - Method and system having switching network for testing semiconductor components on a substrate (2005-02-08),
3. 6798224 - Method for testing semiconductor wafers (2004-09-28),
4. 6677776 - Method and system having switching network for testing semiconductor components on a substrate (2004-01-13),
5. 6466047 - System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources (2002-10-15),
6. 6433574 - Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources (2002-08-13),
7. 6366112 - Probe card having on-board multiplex circuitry for expanding tester resources (2002-04-02),
8. 6359456 - Probe card and test system for semiconductor wafers (2002-03-19),
9. 6356098 - Probe card, test method and test system for semiconductor wafers (2002-03-12),
10. 6337577 - Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources (2002-01-08),
11. 6300786 - Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources (2001-10-09),
12. 6275052 - Probe card and testing method for semiconductor wafers (2001-08-14),
13. 6246250 - Probe card having on-board multiplex circuitry for expanding tester resources (2001-06-12),
14. 6246245 - Probe card, test method and test system for semiconductor wafers (2001-06-12),
15. 6060891 - Probe card for semiconductor wafers and method and system for testing (2000-05-09),

Title: The Innovative Journey of Inventor C. Patrick Doherty

Introduction: C. Patrick Doherty, a talented inventor based in Boise, ID, has made significant contributions to the field of innovation with his creative ideas and problem-solving skills.

Latest Patents: C. Patrick Doherty holds several patents in various industries, including technology, healthcare, and consumer goods. His recent patents focus on improving efficiency in renewable energy systems and enhancing user experience in electronic devices.

Career Highlights: With a background in engineering and a passion for inventing, C. Patrick Doherty has successfully brought numerous ideas to life. His career highlights include developing groundbreaking solutions for sustainable energy production and creating user-friendly products that have gained widespread acclaim.

Collaborations: Throughout his career, C. Patrick Doherty has collaborated with leading companies in the technology sector to bring his inventions to the market. His partnerships have been instrumental in turning his innovative concepts into tangible products that benefit society.

Conclusion: In conclusion, C. Patrick Doherty stands out as a visionary inventor who continues to push the boundaries of innovation. His dedication to creating practical solutions to complex problems has earned him recognition in the industry and inspired the next generation of inventors.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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