Suwon-si, South Korea

Byung-Sug Lee


Average Co-Inventor Count = 5.3

ph-index = 2

Forward Citations = 10(Granted Patents)


Location History:

  • Gyeonggi-do, KR (2008)
  • Suwon-si, KR (2008 - 2009)

Company Filing History:


Years Active: 2008-2009

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4 patents (USPTO):Explore Patents

Title: Byung-Sug Lee: Innovator in Defect Inspection Technologies

Introduction

Byung-Sug Lee is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of defect inspection technologies, holding a total of 4 patents. His innovative methods have advanced the way defects are identified and classified in various objects.

Latest Patents

Lee's latest patents include a "Method of inspecting for defects and apparatus for performing the method." This method involves irradiating a first light onto a bare object and capturing a first reflection signal. A second light is then directed onto a processed object, generating a second reflection signal. By differentiating these signals, defects on the processed object can be detected through a comparison of the respective differential signals. The method allows for precise identification of defects based on signal deviations.

Another notable patent is the "Method of classifying defects." This method utilizes multi-wavelength light to irradiate an object, splitting the reflected light into beams of different wavelengths. By obtaining image information based on these beams, a characteristic matrix is formed. This matrix is analyzed to determine the types of defects present, allowing for accurate classification based on the reactivity of each defect under varying wavelengths and inspection conditions.

Career Highlights

Byung-Sug Lee is currently employed at Samsung Electronics Co., Ltd., where he continues to develop innovative solutions in defect inspection. His work has been instrumental in enhancing the quality control processes within the company.

Collaborations

Lee collaborates with notable colleagues, including Yu-sin Yang and Ki-Suk Chung, who contribute to his research and development efforts.

Conclusion

Byung-Sug Lee's contributions to defect inspection technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in identifying and classifying defects, making him a valuable asset in the field.

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