This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2017.
Company Filing History:
Years Active: 2017
Title: Buzz Graves: Innovator in Inspection Technology
Introduction
Buzz Graves is a notable inventor based in Los Gatos, California. He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work focuses on enhancing the capabilities of inspection apparatuses, which are crucial in various scientific and industrial applications.
Latest Patents
Buzz Graves holds a patent for a "System and method for simultaneous dark field and phase contrast inspection." This inspection apparatus is designed to perform simultaneous dark field (DF) and differential interference contrast (DIC) inspections. It includes an illumination source and a sample stage that secures the sample. The apparatus features a first sensor, a second sensor, and an optical sub-system. The optical sub-system is equipped with an objective and various optical elements that direct illumination from the sources to the sample's surface. The objective collects signals from the sample, which may include scattering-based and phase-based signals. Additionally, the apparatus incorporates separation optical elements that spatially separate the collected signals into DF and DIC signals, directing them along their respective paths.
Career Highlights
Buzz Graves is associated with Kla Tencor Corporation, where he has contributed to advancements in inspection technologies. His work has been instrumental in developing systems that improve the accuracy and efficiency of inspections in various applications.
Collaborations
Throughout his career, Buzz has collaborated with talented individuals such as Chuanyong Huang and Qing Li. These collaborations have further enriched his work and contributed to the development of innovative technologies in the field.
Conclusion
Buzz Graves is a distinguished inventor whose work in inspection technology has led to significant advancements in the field. His patent for simultaneous dark field and phase contrast inspection exemplifies his innovative spirit and dedication to improving inspection methodologies.