Kedah, Malaysia

Burhan Zaini

This inventor holds 2 USPTO granted patents. Top assignee: Agilent Technologies, Inc.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Burhan Zaini. Retrieved from https://idiyas.com/inventor/burhan-zaini

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2006

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2 patents (USPTO):Explore Patents

Title: Burhan Zaini: Innovator in Network Analyzer Calibration

Introduction

Burhan Zaini is a notable inventor based in Kedah, Malaysia. He has made significant contributions to the field of network analyzer calibration, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

His latest patents include a "Multiport Network Analyzer Calibration Employing Reciprocity of a Device" and "Network Analyzer Calibration Employing Reciprocity of a Device." These inventions focus on employing measurements of asymmetric reciprocal devices to determine parameter values of calibration standards. The methods he developed optimize error coefficients of error models in multiport vector network analyzers, enhancing their calibration processes.

Career Highlights

Burhan Zaini is currently associated with Agilent Technologies, Inc., a leading company in electronic measurement and calibration solutions. His work at Agilent has allowed him to push the boundaries of technology in network analysis.

Collaborations

He has collaborated with esteemed colleagues such as Tiberiu Jamneala and David A Feld, contributing to advancements in their shared field of expertise.

Conclusion

Burhan Zaini's innovative work in network analyzer calibration has established him as a key figure in the industry. His patents reflect a commitment to improving measurement accuracy and efficiency in electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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