The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2006

Filed:

Jan. 14, 2004
Applicants:

Tiberiu Jamneala, San Francisco, CA (US);

Burhan Zaini, Kedah, MY;

David A. Feld, Newark, CA (US);

Inventors:

Tiberiu Jamneala, San Francisco, CA (US);

Burhan Zaini, Kedah, MY;

David A. Feld, Newark, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multiport vector network analyzer calibration employs measurements of an asymmetric reciprocal device to determine a value of a defining parameter of a calibration standard in a set of calibration standards. A method of determining a parameter value determines and reports the parameter value. A method of compensating a calibration determines the parameter value and employs the determined parameter value to optimize a set of error coefficients of an error model of the multiport vector network analyzer. A multiport vector network analyzer that includes a controller, a test set, and computer program executed by the controller, compensates a calibration using the determined parameter value and a set of optimized error coefficients. A calibration compensation system that includes a multiport vector network analyzer, a computer, and a computer program executed by the computer, determines and reports the parameter value.


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