Richland, WA, United States of America

Bryan A Stanfill


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovations of Bryan A. Stanfill: A Pioneer in Electron Microscopy

Introduction

Bryan A. Stanfill, a dedicated inventor based in Richland, WA, has made significant contributions to the field of electron microscopy. With a focus on enhancing the analytical capabilities of electron microscope systems, his innovative approach has resulted in the development of new methods and technologies that streamline data acquisition and analysis.

Latest Patents

Stanfill holds one patent titled "Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets." This patent discloses methods for sensing conditions of an electron microscope system and the specimen being analyzed. It introduces sensor systems and electron microscope systems capable of sensing both system conditions and those of the specimen. One notable feature of his invention is the ability to acquire a sparse dataset through random sub-sampling of the specimen using an electron beam probe, enabling estimation of instrument parameters and specimen characteristics from limited data.

Career Highlights

Currently employed at Battelle Memorial Institute, Stanfill's work is instrumental in advancing research and technological applications in microscopy. His commitment to exploration and innovation has positioned him as a key figure in his field. With a strong focus on improving electronic systems, he continues to develop methods that enhance the efficiency and effectiveness of electron microscopy.

Collaborations

Throughout his career, Stanfill has collaborated with notable colleagues, including Sarah M. Reehl and Margaret C. Johnson. These collaborations have fostered a rich environment of innovation, allowing for the exchange of ideas and expertise that further enhances the research and development processes within their projects.

Conclusion

Bryan A. Stanfill exemplifies the spirit of innovation and collaboration in science and technology. His patent on sensing analytical instrument parameters demonstrates not only his individual creativity but also his ability to work alongside fellow researchers to drive advancements in electron microscopy. As the field continues to evolve, contributions from inventors like Stanfill will undoubtedly play a pivotal role in shaping the future of analytical instrumentation.

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