Bruce Kaufman

Title: Bruce Kaufman: Innovator in Chip Diagnostics Management

Introduction

Bruce Kaufman is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of integrated circuit devices through his innovative patent. His work focuses on enhancing the efficiency and security of chip diagnostics management systems.

Latest Patents

Kaufman's most recent patent is titled "Secure test-for-yield chip diagnostics management system and method." This invention includes a chip diagnostics management system that incorporates secure design information defining the production features of integrated circuit devices. The system is designed to be accessible according to selected levels of access privilege. It features a database of device defect information that includes details of defects in devices produced according to the design information and associated wafers, production lots, and dies. A diagnostic manager correlates device defect information from multiple wafers with the design information to identify device locations likely associated with defects. Additionally, a diagnostic manager viewer indicates the device location along with the amount of design information correlated to the access privilege assigned to a selected user.

Career Highlights

Kaufman is currently employed at Teseda Corporation, where he continues to develop innovative solutions in chip diagnostics. His work has been instrumental in advancing the technology used in integrated circuits, making significant impacts in the industry.

Collaborations

Some of his notable coworkers include Ralph Sanchez and Brian Mason, who have collaborated with him on various projects at Teseda Corporation.

Conclusion

Bruce Kaufman is a distinguished inventor whose contributions to chip diagnostics management systems have paved the way for advancements in integrated circuit technology. His innovative patent reflects his commitment to enhancing the efficiency and security of electronic devices.