The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Apr. 02, 2007
Applicants:

Bruce Kaufman, Portland, OR (US);

Ralph Sanchez, Amity, OR (US);

Brian Mason, Aloha, OR (US);

Inventors:

Bruce Kaufman, Portland, OR (US);

Ralph Sanchez, Amity, OR (US);

Brian Mason, Aloha, OR (US);

Assignee:

Teseda Corporation, Portland, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G06F 11/30 (2006.01); G06F 11/32 (2006.01); G06F 17/40 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A chip diagnostics management system includes secure design information that define production features of integrated circuit devices and are accessible according to selected levels of access privilege. A database of device defect information includes information of defects of devices produced according to the production features of the design information and associated wafers, production lots, and dies in or with which the devices were produced. A diagnostic manager correlates device defect information from plural wafers with the design information to identify a device location with a probability of being associated with the device defect information. A diagnostic manager viewer indicates the device location together with an amount of design information correlated the level of access privilege assigned to a selected user.


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