Company Filing History:
Years Active: 2014
Title: Brian Mason - Innovator in Chip Diagnostics Management
Introduction
Brian Mason is a notable inventor based in Aloha, Oregon. He has made significant contributions to the field of integrated circuit devices through his innovative work in chip diagnostics management systems. His expertise and dedication to advancing technology have led to the development of a unique patent that addresses critical challenges in the industry.
Latest Patents
Brian Mason holds a patent for a "Secure test-for-yield chip diagnostics management system and method." This system includes secure design information that defines production features of integrated circuit devices, which are accessible according to selected levels of access privilege. The patent also describes a database of device defect information that includes details of defects in devices produced according to the design information and associated wafers, production lots, and dies. A diagnostic manager correlates device defect information from multiple wafers with the design information to identify device locations likely associated with defects. Additionally, a diagnostic manager viewer indicates the device location along with the amount of design information correlated to the access privilege assigned to a selected user.
Career Highlights
Brian Mason is currently employed at Teseda Corporation, where he continues to innovate and contribute to advancements in chip diagnostics. His work has been instrumental in enhancing the reliability and efficiency of integrated circuit devices.
Collaborations
Throughout his career, Brian has collaborated with talented individuals such as Bruce Kaufman and Ralph Sanchez. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.
Conclusion
Brian Mason's contributions to the field of chip diagnostics management exemplify the impact of innovation in technology. His patent and ongoing work at Teseda Corporation highlight his commitment to improving integrated circuit devices.