Plano, TX, United States of America

Bright Qi


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Bright Qi - Innovator in Spherical Surface Inspection Technology

Introduction

Bright Qi is a notable inventor based in Plano, Texas, who has made significant contributions to the field of inspection technology. He holds a patent for a unique spherical surface inspection system that enhances the way spherical-shaped objects are analyzed. His innovative approach combines advanced software and optical sensors to improve inspection accuracy.

Latest Patents

Bright Qi's most recent patent is for a spherical surface inspection system. This system comprises a controller equipped with software, an optical sensor connected to the controller, and an inspection device positioned adjacent to the optical sensor. The inspection device is designed to retain and rotate spherical-shaped objects along two axes, allowing the optical sensor to capture comprehensive images of the object's surface. This method significantly enhances the inspection process by providing detailed visual data to the controller.

Career Highlights

Bright Qi is currently employed at Ball Semiconductor Corporation, where he applies his expertise in inspection technology. His work at the company has positioned him as a key player in developing innovative solutions for the semiconductor industry. His dedication to advancing technology is evident in his patent and ongoing projects.

Collaborations

Bright Qi collaborates with talented individuals such as Wenhui Mei and Bei Chen. Their combined efforts contribute to the development of cutting-edge technologies in their field.

Conclusion

Bright Qi's contributions to spherical surface inspection technology exemplify his innovative spirit and commitment to advancing the industry. His patent and work at Ball Semiconductor Corporation highlight his role as a significant inventor in the field.

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