The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2002

Filed:

Nov. 13, 2000
Applicant:
Inventors:

Wenhui Mei, Plano, TX (US);

Bright Qi, Plano, TX (US);

Bei Chen, Plano, TX (US);

Assignee:

Ball Semiconductor, Inc., Allen, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/101 ;
U.S. Cl.
CPC ...
G01N 2/101 ;
Abstract

Method and apparatus are described for a spherical surface inspection system comprising a controller having software, an optical sensor connected to the controller, and an inspection device disposed adjacent to the optical sensor, and connected to the controller. The inspection device is for retaining and rotating the spherical-shaped object along a first axis to allow the optical sensor to convey an image of a portion of the surface of the spherical-shaped object to the controller. The inspection device also rotates the spherical-shaped object along a second axis to convey an image of more of the surface of the spherical-shaped object to the controller.


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