Bei Chen

Title: Innovations of Bei Chen in Spherical Surface Inspection

Introduction

Bei Chen is an accomplished inventor based in Plano, Texas. He has made significant contributions to the field of inspection systems, particularly with his innovative approach to spherical surface inspection. His work has implications for various industries that require precise surface analysis.

Latest Patents

Bei Chen holds a patent for a "Spherical Surface Inspection System." This invention describes a method and apparatus that includes a controller with software, an optical sensor connected to the controller, and an inspection device positioned adjacent to the optical sensor. The inspection device is designed to retain and rotate a spherical-shaped object along a first axis, allowing the optical sensor to capture an image of a portion of the object's surface. Additionally, the device rotates the object along a second axis to provide a more comprehensive view of the surface.

Career Highlights

Bei Chen is currently employed at Ball Semiconductor Corporation, where he applies his expertise in developing advanced inspection technologies. His innovative work has positioned him as a key figure in the field, contributing to the company's reputation for excellence in semiconductor solutions.

Collaborations

Bei Chen collaborates with talented individuals such as Wenhui Mei and Bright Qi. Their combined efforts enhance the development of cutting-edge technologies in the inspection domain.

Conclusion

In summary, Bei Chen's contributions to spherical surface inspection technology demonstrate his innovative spirit and commitment to advancing the field. His patent and work at Ball Semiconductor Corporation highlight his role as a leading inventor in this specialized area.