Bennington, NE, United States of America

Brianna Dufek

This inventor holds 1 USPTO granted patent. Top assignee: Elemental Scientific, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brianna Dufek. Retrieved from https://idiyas.com/inventor/brianna-dufek-nyrsuef8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Brianna Dufek and Semiconductor Wafer Contamination Recovery

Introduction

Brianna Dufek is an inventor associated with Bennington, Nebraska, and Elemental Scientific, Inc. Her patent work addresses methods for detecting and recovering organic contaminants from semiconducting wafers.

Latest Patents

Dufek is credited with 1 patent: “Systems and Methods for Recovering Organic Contaminants from Semiconducting Wafers.” The patent describes an integrated approach to decomposing and scanning a wafer for organic and inorganic impurities. In one method, a nozzle directs an organic-containing scan fluid onto the wafer’s surface, where it interacts with organic contaminants. The nozzle then removes the fluid along with at least some of those contaminants.

Career Highlights

Dufek’s listed invention focuses on semiconductor wafer processing and contamination control. The described system combines fluid delivery and removal through a nozzle positioned above a wafer supported in or near a chamber.

Collaborations

Dufek’s listed coworkers include Jacob Unnerstall and Daniel R. Wiederin. Her patent is associated with Elemental Scientific, Inc.

Conclusion

Brianna Dufek’s patent documents a targeted approach to identifying and removing organic contaminants from semiconducting wafers, contributing to work in semiconductor processing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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