Brian S Birtell

Title: Brian S Birtell: Innovator in Statistical Measurement Analysis

Introduction

Brian S Birtell is a notable inventor based in Falls Church, VA (US). He has made significant contributions to the field of statistical measurement analysis, showcasing his expertise through his innovative patent.

Latest Patents

Brian S Birtell holds a patent for "Enhanced Statistical Measurement Analysis and Reporting." This invention involves receiving project information that identifies a project type, an authorized write entity, and an authorized approval entity. A valid metric is selected based on the project type, measuring an aspect of the project's performance. The patent details the process of receiving base measures from the authorized write entity, which includes periodic and aperiodic base measures. The valid metric is calculated based on these base measures, which are sorted into excluded and non-excluded categories. Additionally, organizational baseline data is imported to calculate an organizational indicator based on the non-excluded base measures.

Career Highlights

Brian is currently employed at Accenture Global Services GmbH, where he applies his skills in statistical analysis and reporting. His work contributes to enhancing project performance metrics and improving organizational efficiency.

Collaborations

Throughout his career, Brian has collaborated with notable colleagues, including Jeffrey R Amspaugh and Christine Rebok. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Brian S Birtell is a distinguished inventor whose work in statistical measurement analysis has made a significant impact in his field. His patent reflects his commitment to improving project performance through innovative solutions.