IDiyas

For the Inventor, By the Inventor

Milton, VT, United States of America

Brian Neal Caldwell

USPTO Granted Patents = 7

Average Co-Inventor Count = 4.2

ph-index = 2

Forward Citations = 15(Granted Patents)


Location History:

  • Milton, VT (US) (2007 - 2013)
  • Meridian, ID (US) (2016 - 2018)

Company Filing History:

goldMedal7 out of 164,108 
 
International Business Machines Corporation
 patents
silverMedal3 out of 1,268 
 
Toppan Printing Co., Ltd.
 patents
where one patent can have more than one assignee

Years Active: 2007-2018

where 'Filed Patents' based on already Granted Patents

7 patents (USPTO):
1. 9996000 - Test pattern layout for test photomask and method for evaluating critical dimension changes (2018-06-12),
2. 9989843 - Test pattern layout for test photomask and method for evaluating critical dimension changes (2018-06-05),
3. 9372394 - Test pattern layout for test photomask and method for evaluating critical dimension changes (2016-06-21),
4. 8586950 - Method and system for feature function aware priority printing (2013-11-19),
5. 8227774 - Method and system for feature function aware priority printing (2012-07-24),
6. 7496885 - Method of compensating for defective pattern generation data in a variable shaped electron beam system (2009-02-24),
7. 7198276 - Adaptive electrostatic pin chuck (2007-04-03),
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